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| 영문초록 |
| This paper presents a design of environmental stress screening(ESS) for a temperature compensated crystal oscillator(TCXO). From the field data analysis, it is estimated that early failures of TCXOs are due to the instability of frequency. A simulation study was made to identify the frequency characteristic of TCXO with defect in the manufacturing process, and thermal cycling is selected as an environmental stress for disclosing frequency shift. The design of experiment using orthogonal array is planned to find out the optimum screening parameters maximizing screening strength. Test samples with known frequency characteristics are prepared to measure the screening strength. Maximum and minimum temperatures are predetermined from the component specification, and temperature change rate, soak time, and the number of cycles are selected as control variables. The frequencies of samples are measured to verify whether defect-free TCXOs are weakened or destroyed. The optimum ESS maximizing screening strength is obtained, and the performances with and without screening are compared from the real manufacturing process through a follow-up study. |
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| 도움말 |
| 본 논문은 참고용 논문으로 수정 및 텍스트 복사가 되지 않습니다. |
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| 저작권 정보 |
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| 본 학술논문은 한국학술정보㈜ 각 학회간에 저작권 계약이 체결된 것으로 HAPPY학술이 제공하고 있습니다. 본 저작물을 불법적으로 이용시는 법적인 제재가 가해질 수 있습니다. |
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