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분야
pptx2.Research
3.Experimental procedure
4.Result
5.Conclusion
Features of metallurgical specimens such as grains, gbs, cracks, ppts can be distinguished because they differ in contrast, caused by the differences in (a) the amount of light absorbed and (b) the inclination of those atomic planes that reflect the light
Microscope consists of objective lens and eyepiece
The scanning electron microscope (SEM) is a type of electron microscope that images the sample surface by scanning it with a high-energy beam of electrons in a raster scan pattern.
- Electron gun : tungsten filament cathode(high mp and low vapor pressure) which thermionically emits electron beam of typically 0.5keV to 40 keV. - Condensor lenses : focus the electron beam to a spot about 0.4 nm to 5 nm in diameter. - Deflection coils : deflect the beam in the x and y axes so that it scans in a raster fashion over a rectangular area of the sample surface.
