소개글
[신소재공학]X선회절분석법의 원리 및 활용의 이해에 대한 자료입니다.
목차
Purpose
Background knowledge
Process of experiment
Result & Analysis
2θ, intensity, 면간격
격자상수
반측폭(시편결정립 크기)
Error analysis
Conclusion
본문내용
P u r p o s e
To understand XRD and analysis JCPDS card, we analyzed and studied the figure of XRD and did research and discuss background knowledge. Also we expect that we can find important information of XRD by doing experiment
Process of experiment
XRD is equipment that use characteristic X-rays. Through characteristic X-rays diffraction peak of material, we can examine closely unknown Specimen. Theory that is used in this equipment is Bragg's law(2d sinθ = nλ). d is distance between atomics, and path difference is dsinθ. n is integer. In XRD detector is measured by 2θ, and intensity value appears at peculiar position in material. For this reason we can find alloy's components.
process
1) Prepare slide to put specimen
2) After putting specimen inside slide, bloom evenly by using thin glass.
If specimen remained by putting much compositions, push out by thin glass.